A Framework for Fast Graph-based Pattern Matching in Conceptual Models

Pflanzl Nicolas, Breuker Dominic, Dietrich Hanns-Alexander, Steinhorst Matthias, Shitkova Maria, Becker Jörg, Delfmann Patrick


Abstract
We introduce a pattern matching approach for conceptual models suitable for a number of model analysis scenarios like process weakness detection, process compliance checking, syntax verification and model translation. The approach does not depend on any particular modeling language which is achieved by treating conceptual models as labeled graphs. Consequently, we use pattern matching techniques known from algorithmic graph theory – subgraph isomorphism and subgraph homeomorphism. In general, algorithms solving these problems can be computationally expensive. However, special properties of conceptual models such as low treewidth and planarity can be exploited to keep computational complexity manageable. This makes pattern matching appli-cable even to large models typically used in large companies or corporate groups. We introduce a high-level meta algorithm checking structural properties of input models and patterns to decide which low-level pattern matching algorithm will likely deliver search results quickest.

Keywords
conceptual modeling, conceptual model analysis, pattern matching, subgraph isomorphism, subgraph homeomorphism, planarity, treewidth



Publication type
Conference paper

Peer reviewed
Yes

Publication status
Published

Year
2013

Conference
15th IEEE Conference on Business Informatics (CBI) 2013

Venue
Vienna, Austria

Pages range
250-257

Language
English

ISBN
978-0-7685-5072-5

DOI