A Framework for Fast Graph-based Pattern Matching in Conceptual Models

Pflanzl Nicolas, Breuker Dominic, Dietrich Hanns-Alexander, Steinhorst Matthias, Shitkova Maria, Becker Jörg, Delfmann Patrick


Zusammenfassung
We introduce a pattern matching approach for conceptual models suitable for a number of model analysis scenarios like process weakness detection, process compliance checking, syntax verification and model translation. The approach does not depend on any particular modeling language which is achieved by treating conceptual models as labeled graphs. Consequently, we use pattern matching techniques known from algorithmic graph theory – subgraph isomorphism and subgraph homeomorphism. In general, algorithms solving these problems can be computationally expensive. However, special properties of conceptual models such as low treewidth and planarity can be exploited to keep computational complexity manageable. This makes pattern matching appli-cable even to large models typically used in large companies or corporate groups. We introduce a high-level meta algorithm checking structural properties of input models and patterns to decide which low-level pattern matching algorithm will likely deliver search results quickest.

Schlüsselwörter
conceptual modeling, conceptual model analysis, pattern matching, subgraph isomorphism, subgraph homeomorphism, planarity, treewidth



Publikationstyp
Aufsatz (Konferenz)

Begutachtet
Ja

Publikationsstatus
Veröffentlicht

Jahr
2013

Konferenz
15th IEEE Conference on Business Informatics (CBI) 2013

Konferenzort
Vienna, Austria

Seiten
250-257

Sprache
Englisch

ISBN
978-0-7685-5072-5

DOI