Batch Steepest-Descent-Mildest-Ascent for Interactive Maximum Margin Clustering
Gieseke F, Pahikkala T, Heskes T
Publication type
Research article in proceedings (conference)
Peer reviewed
Yes
Publication status
Published
Year
2015
Conference
Advances in Intelligent Data Analysis
Venue
Saint Etienne, France
Book title
Advances in Intelligent Data Analysis XIV - 14th International Symposium, IDA 2015, Saint Etienne, France, October 22-24, 2015, Proceedings
Editor
Fromont, Bie TD, Leeuwen M
Start page
95
End page
107
Volume
9385
Title of series
Lecture Notes in Computer Science
Publisher
Springer
Language
English
DOI
Full text