Detecting Spring Configurations Errors
von Hof V, Fögen K, Kuchen H
Publication type
Research article in proceedings (conference)
Peer reviewed
Yes
Publication status
Published
Year
2017
Conference
The 32nd ACM Symposium On Applied Computing (SAC '17)
Venue
Marrakesh, Morocco
Book title
SAC '17 Proceedings of the Symposium on Applied Computing
Editor
Shin Sung Y., Shin Dongwan, Lencastre Maria
Publisher
ACM
Place
New York, NY, USA
Language
English
ISBN
978-1-4503-4486-9