Detecting Spring Configurations Errors

von Hof V, Fögen K, Kuchen H



Publication type
Conference Paper

Peer reviewed
Yes

Publication status
Published

Year
2017

Conference
The 32nd ACM Symposium On Applied Computing (SAC '17)

Venue
Marrakesh, Morocco

Book title
SAC '17 Proceedings of the Symposium on Applied Computing

Editor
Shin Sung Y., Shin Dongwan, Lencastre Maria

Publisher
ACM

Place
New York, NY, USA

ISBN
978-1-4503-4486-9